Thursday, March 8, 2012

1203.1576 (M. Kuźniak et al.)

Surface roughness interpretation of 730 kg days CRESST-II results    [PDF]

M. Kuźniak, M. G. Boulay, T. Pollmann
The analysis presented in the recent publication of the CRESST-II results finds a statistically significant excess of registered events over known background contributions in the acceptance region and attributes the excess to a possible Dark Matter signal, caused by scattering of relatively light WIMPs. We propose a mechanism which explains the excess events with ion sputtering caused by 206Pb recoils and alpha particles from 210Po decay, combined with realistic surface roughness effects.
View original: http://arxiv.org/abs/1203.1576

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